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                                       Details for article 9 of 13 found articles
 
 
  Making use of semiconductor manufacturing process variations: FinFET-based physical unclonable functions for efficient security integration in the IoT
 
 
Title: Making use of semiconductor manufacturing process variations: FinFET-based physical unclonable functions for efficient security integration in the IoT
Author: Yanambaka, Venkata P.
Mohanty, Saraju P.
Kougianos, Elias
Appeared in: Analog integrated circuits and signal processing
Paging: Volume 93 (2017) nr. 3 pages 429-441
Year: 2017
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 13 found articles
 
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