|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 14 of 17 found articles
| Title: |
Short critical area model and extraction algorithm based on defect characteristics in integrated circuits |
| Author: |
Wang, Jun-Ping Wu, Yao Zhao, Teng-Wei |
| Appeared in: |
Analog integrated circuits and signal processing |
| Paging: | Volume 91 (2016) nr. 1 pages 83-91 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 17 found articles
| << previous | next >> |