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  A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations
 
 
Title: A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations
Author: Arnaud, Alfredo
Hoffmann, Alain
Appeared in: Analog integrated circuits and signal processing
Paging: Volume 89 (2016) nr. 3 pages 611-618
Year: 2016
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 29 found articles
 
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