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Journal description
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Details for article 7 of 35 found articles
| Title: |
An improved compact model for CMOS cross-shaped Hall-effect sensor including offset and temperature effects |
| Author: |
Madec, Morgan Kammerer, Jean-Baptiste Hébrard, Luc Lallement, Christophe |
| Appeared in: |
Analog integrated circuits and signal processing |
| Paging: | Volume 73 (2012) nr. 3 pages 719-730 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 35 found articles
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