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                                       Details for article 3 of 14 found articles
 
 
  A novel technique for stress gradient measurement of electrostatic MEM switches and non ideal anchor’s effects
 
 
Title: A novel technique for stress gradient measurement of electrostatic MEM switches and non ideal anchor’s effects
Author: Rezazadeh, Ghader
Sadeghian, Hamed
Zubtsov, Mikhail
Appeared in: Analog integrated circuits and signal processing
Paging: Volume 62 (2009) nr. 1 pages 43-50
Year: 2009
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 14 found articles
 
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