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Journal description
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Details for article 17 of 17 found articles
| Title: |
Yield analysis for self-repairable MEMS devices |
| Author: |
Xiong, Xingguo Wu, Yu-Liang Jone, Wen-Ben |
| Appeared in: |
Analog integrated circuits and signal processing |
| Paging: | Volume 56 (2008) nr. 1-2 pages 71-81 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 17 found articles
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