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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 16 found articles
| Title: |
Parametric Yield Optimization of MOS IC's Affected by Device Mismatch |
| Author: |
Massimo Conti Paolo Crippa Simone Orcioni Claudio Turchetti |
| Appeared in: |
Analog integrated circuits and signal processing |
| Paging: | Volume 29 (2001) nr. 3 pages 19 p. |
| Year: |
2001-12 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston, U.S.A |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 16 found articles
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