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                                       Details for article 9 of 24 found articles
 
 
  Defect analysis and optimization of nanomaterial-based liner materials for 3D-IC integration
 
 
Title: Defect analysis and optimization of nanomaterial-based liner materials for 3D-IC integration
Author: Tallapalli, Santosh Kumar
Vijayakumar, V.
Panigrahy, Asisa Kumar
Vignesh, N. Arun
Appeared in: Analog integrated circuits and signal processing
Paging: Volume 124 () nr. 2 pages xx
Year: 2025-06-16
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 24 found articles
 
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