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Journal description
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Details for article 9 of 24 found articles
| Title: |
Defect analysis and optimization of nanomaterial-based liner materials for 3D-IC integration |
| Author: |
Tallapalli, Santosh Kumar Vijayakumar, V. Panigrahy, Asisa Kumar Vignesh, N. Arun |
| Appeared in: |
Analog integrated circuits and signal processing |
| Paging: | Volume 124 () nr. 2 pages xx |
| Year: |
2025-06-16 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 24 found articles
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