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Journal description
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Details for article 9 of 14 found articles
| Title: |
Material engineering to enhance reliability in 3D NAND flash memory |
| Author: |
Kim, Ki Han Kim, Namju Kim, Yeong Kwon Kim, Hee Seung Oh, Han Byeol Kim, Chae Eun Shin, Hyeun Woo Kim, Myeong Gi Choi, Won Jun Jang, Byung Chul |
| Appeared in: |
Device |
| Paging: | Volume 3 () nr. 2 pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 14 found articles
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