Fixed charges at the HfO 2 /SiO2 interface: Impact on the memory window of FeFET
Titel:
Fixed charges at the HfO 2 /SiO2 interface: Impact on the memory window of FeFET
Auteur:
Sk, Masud Rana Pande, Shubham Müller, Franz Raffel, Yannick Lederer, Maximilian Pirro, Luca Beyer, Sven Seidel, Konrad Kämpfe, Thomas De, Sourav Chakrabarti, Bhaswar
Verschenen in:
Memories, materials, devices, circuits and systems