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Journal description
All volumes of the corresponding journal
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Details for article 2 of 8 found articles
| Title: |
Device and circuit-level assessment of temperature variation on the DC, Analog/RF and linearity performance metrics of III-V TFETs for reliability |
| Author: |
Verma, Priyanka Kumar, Satyendra |
| Appeared in: |
Micro and nanostructures |
| Paging: | Volume 202 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 8 found articles
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