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Journal description
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Details for article 10 of 18 found articles
| Title: |
Estimation of process-induced variability in SiGe-GAA-NWTFET to improve reliability |
| Author: |
Singh, Sadhana Chaudhary, Tarun |
| Appeared in: |
Micro and nanostructures |
| Paging: | Volume 189 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 18 found articles
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