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Comparative analysis of strain engineering on the electronic properties of homogenous and heterostructure bilayers of MoX2 (X = S, Se, Te) |
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Titel: |
Comparative analysis of strain engineering on the electronic properties of homogenous and heterostructure bilayers of MoX2 (X = S, Se, Te) |
Auteur: |
Palepu, Joshna Anand, P. Pranav Parshi, Pradyumna Jain, Vishesh Tiwari, Aditya Bhattacharya, Sandip Chakraborty, Sudipta Kanungo, Sayan |
Verschenen in: |
Micro and nanostructures |
Paginering: |
Jaargang 168 () nr. C pagina's p. |
Jaar: |
2022 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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