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                                       Details for article 6 of 13 found articles
 
 
  Reliability Behavior of A Resin-Free Nanosilver Paste at Ultra-Low Temperature of 180°C
 
 
Title: Reliability Behavior of A Resin-Free Nanosilver Paste at Ultra-Low Temperature of 180°C
Author: Zhang, Bowen
Chen, Shi
Lu, Guo-Quan.
Mei, Yun-Hui.
Appeared in: Power electronic devices and components
Paging: Volume 3 () nr. C pages p.
Year: 2022
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 13 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands