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Journal description
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Details for article 78 of 124 found articles
| Title: |
Impact of deep cryogenic temperatures on gate stack dual material DG MOSFET performance: Analog and RF analysis |
| Author: |
Das, Satish K. Biswal, Sudhansu M. Giri, Lalat Indu Nanda, Umakanta |
| Appeared in: |
e-Prime, advances in electrical engineering, electronics and energy |
| Paging: | Volume 9 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
The Author(s) |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 78 of 124 found articles
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