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Effect of thermal cycling on the strain and stress distribution of TSVs and solder bumps in stacked package structure |
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Titel: |
Effect of thermal cycling on the strain and stress distribution of TSVs and solder bumps in stacked package structure |
Auteur: |
Xia, Yangjing Su, Yahui Xu, Xin Ju, Lina Zhang, Rui Xue, Yuxiong Liu, Yang Zhang, Shuye |
Verschenen in: |
e-Prime, advances in electrical engineering, electronics and energy |
Paginering: |
Jaargang 5 () nr. C pagina's p. |
Jaar: |
2023 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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