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                                       Details for article 33 of 42 found articles
 
 
  Shear performance and accelerated reliability of solder interconnects for fan-out wafer-level package
 
 
Title: Shear performance and accelerated reliability of solder interconnects for fan-out wafer-level package
Author: Zhang, Shuye
Duan, Ran
Xu, Sunwu
Xue, Panfei
Wang, Chengqian
Chen, Jieshi
Paik, Kyung-Wook
He, Peng
Appeared in: Journal of advanced joining processes
Paging: Volume 5 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Author(s)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 42 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands