Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement
Titel:
Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement
Auteur:
Sugden, Karen Hannon, Eilis J. Arseneault, Louise Belsky, Daniel W. Corcoran, David L. Fisher, Helen L. Houts, Renate M. Kandaswamy, Radhika Moffitt, Terrie E. Poulton, Richie Prinz, Joseph A. Rasmussen, Line J.H. Williams, Benjamin S. Wong, Chloe C.Y. Mill, Jonathan Caspi, Avshalom