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Journal description
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Details for article 5 of 6 found articles
| Title: |
Resolving deep sub-wavelength scattering of nanoscale sidewalls using parametric microscopy |
| Author: |
Yadav, Nagendra Parasad Xiong, Ji-Chuan Liu, Wei-Ping Wang, Wei-Ze Cao, Yun Kumar, Ashish Liu, Xue-Feng |
| Appeared in: |
Journal of electronic science and technology |
| Paging: | Volume 19 () nr. 3 pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
University of Electronic Science and Technology of China |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 6 found articles
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