Assessing tolerances in direct write laser grayscale lithography and reactive ion etching pattern transfer for fabrication of 2.5D Si master molds
Titel:
Assessing tolerances in direct write laser grayscale lithography and reactive ion etching pattern transfer for fabrication of 2.5D Si master molds
Auteur:
Cunha, Joao Garcia, Inês S. Santos, Joana D. Fernandes, José González-Losada, Pedro Silva, Carlos Gaspar, João Cortez, Ana Sampaio, Marcos Aguiam, Diogo E.