|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 3 of 64 found articles
| Title: |
A novel method to determine Ga profile in CIGS thin film compound via focused ion beam modification |
| Author: |
Xue, Chaowei Spaulding, David Duong, Anh Loi, Huu-Ha Parker, Magdalena Bayman, Atiye Zhang, Jie |
| Appeared in: |
Materialia |
| Paging: | Volume 16 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 64 found articles
| << previous | next >> |