|
Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films |
|
|
|
Titel: |
Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films |
Auteur: |
Zheng, Yunzhe Zhang, Yuke Xin, Tianjiao Xu, Yilin Qu, Shuangquan Zheng, Junding Gao, Zhaomeng Zhong, Qilan Wang, Yiwei Feng, Xiaoyu Zheng, Yonghui Cheng, Yan Shao, Ruiwen Lin, Fang Lin, Xiaoling Tian, He Huang, Rong Duan, Chungang Lyu, Hangbing |
Verschenen in: |
Materials today nano |
Paginering: |
Jaargang 24 () nr. C pagina's p. |
Jaar: |
2023 |
Inhoud: |
|
Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|