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A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices |
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Titel: |
A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices |
Auteur: |
Lin, C.-Y. Chen, P.-H. Chang, T.-C. Huang, W.-C. Tan, Y.-F. Lin, Y.-H. Chen, W.-C. Lin, C.-C. Chang, Y.-F. Chen, Y.-C. Huang, H.-C. Ma, X.-H. Hao, Y. Sze, S.M. |
Verschenen in: |
Materials today physics |
Paginering: |
Jaargang 13 () nr. C pagina's p. |
Jaar: |
2020 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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