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  Determining phonon mean free path spectrum by ballistic phonon resistance within a nanoslot-patterned thin film
 
 
Title: Determining phonon mean free path spectrum by ballistic phonon resistance within a nanoslot-patterned thin film
Author: Hao, Q.
Xiao, Y.
Chen, Q.
Appeared in: Materials today physics
Paging: Volume 10 (2019) nr. C pages p.
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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