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                                       Details for article 99 of 113 found articles
 
 
  Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
 
 
Title: Scanning Probe Microscopy using Higher-Mode Electrostatically-Actuated Microcantilevers
Author: Sahoo, Deepak R.
Kartik, V.
Sebastian, Abu
Pozidis, Haralampos
Appeared in: IFAC proceedings volumes
Paging: Volume 43 (2010) nr. 18 pages 8 p.
Year: 2010
Contents:
Publisher: IFAC
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 99 of 113 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands