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                                       Details for article 18 of 57 found articles
 
 
  Electromagnetic interference shielding performance and structure of multilayered NiFe/Cu thin films: Effects of impedance and defects
 
 
Title: Electromagnetic interference shielding performance and structure of multilayered NiFe/Cu thin films: Effects of impedance and defects
Author: Kwon, Hyun Jun
Park, Jong-Hwan
Park, JungHo
Shin, Se Hee
Kim, Ki Hyeon
Suh, Su Jeong
Appeared in: Surfaces and interfaces
Paging: Volume 50 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 57 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands