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                                       Details for article 9 of 13 found articles
 
 
  Nanoscale investigations: Surface potential of rare-earth oxide (Re2O3) thin films by kelvin probe force microscopy for next generation CMOS technology
 
 
Title: Nanoscale investigations: Surface potential of rare-earth oxide (Re2O3) thin films by kelvin probe force microscopy for next generation CMOS technology
Author: Kumar, Pawan
Khosla, Robin
Sharma, Satinder K.
Appeared in: Surfaces and interfaces
Paging: Volume 4 (2016) nr. C pages 8 p.
Year: 2016
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 13 found articles
 
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