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Journal description
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Details for article 26 of 32 found articles
| Title: |
Structural characterization of magnetron sputtered ZnO thin films on Si(100) using RBS, scanning and high resolution transmission electron microscopy methods |
| Author: |
Nagabharana, R.M. Kiran, N. Guha, Puspendu Sundaravel, B. Bhatta, Umananda M. |
| Appeared in: |
Surfaces and interfaces |
| Paging: | Volume 15 (2019) nr. C pages 239-243 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 32 found articles
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