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                                       Details for article 17 of 37 found articles
 
 
  Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy
 
 
Title: Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy
Author: Lashkova, Natalia A.
Permiakov, Nikita V.
Maximov, Alexander I.
Spivak, Yulia M.
Moshnikov, Vyacheslav A.
Appeared in: St. Petersburg Polytechnic University journal. Physics and mathematics
Paging: Volume 1 (2015) nr. 1 pages 9 p.
Year: 2015
Contents:
Publisher: St. Petersburg Polytechnic University
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 37 found articles
 
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