|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 167 of 269 found articles
| Title: |
Multi-pass Lot Scheduling Algorithm for Maximizing Throughput at Semiconductor Final Test Facilities |
| Author: |
Joung, Young Min He, Tian Yoon, Sang Won Vancheeswaran, Ravi Abela, Cecille Andres, Herwina R. |
| Appeared in: |
Procedia manufacturing |
| Paging: | Volume 11 (2017) nr. C pages 9 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 167 of 269 found articles
| << previous | next >> |