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Journal description
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Details for article 32 of 40 found articles
| Title: |
Radiation damage analysis in SiC microstructure by transmission electron microscopy |
| Author: |
Idris, Mohd Idzat Yoshida, Katsumi Yano, Toyohiko |
| Appeared in: |
Nuclear engineering and technology |
| Paging: | Volume 54 () nr. 3 pages 991-996 |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Korean Nuclear Society |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 40 found articles
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