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  A study of stoichiometric composition of Ge thermal oxide by X-ray photoelectron spectroscopic depth profiling
 
 
Title: A study of stoichiometric composition of Ge thermal oxide by X-ray photoelectron spectroscopic depth profiling
Author: Anisuzzaman, Mohammad
Ab Manaf, Norani
Saharudin, Suhairi
Yasui, Kanji
Manaf Hashim, Abdul
Appeared in: Materials today: proceedings
Paging: Volume 7 (2019) nr. P2 pages 619-624
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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