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Details for article 3 of 8 found articles
| Title: |
Electric bias-induced edge degradation of few-layer MoS2 devices |
| Author: |
Thiele, Sebastian Eliseyev, Ilya A. Smirnov, Alexander N. Jacobs, Heiko O. Davydov, Valery Y. Schwierz, Frank Pezoldt, Jörg |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 53 () nr. P2 pages 281-284 |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 8 found articles
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