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Journal description
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Details for article 4 of 23 found articles
| Title: |
Electronic Speckle Pattern Interference technique for measuring thickness of metallic nano thin films |
| Author: |
Bhagat, N.B. Padghan, P.P. Kesarwani, R. Khare, A. Alti, K.M. |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 50 () nr. P1 pages 123-128 |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 23 found articles
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