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Details for article 82 of 84 found articles
| Title: |
The influence of image force effect on the accuracy of modeling of tunneling current for ultra thin high-k dielectric material Ta2O5 based MOS devices |
| Author: |
Maity, N.P. Maity, Reshmi Baishya, S. |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 5 (2018) nr. 7P1 pages 15104-15109 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 82 of 84 found articles
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