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Journal description
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Details for article 4 of 14 found articles
| Title: |
Defect-induced Stress Imaging in Single and Multi-crystalline Semiconductor Materials |
| Author: |
Herms, Martin Wagner, Matthias Kayser, Stefan Kießling, Frank M. Poklad, Anna Zhao, Ming Kretzer, Ulrich |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 5 (2018) nr. 6P3 pages 14748-14756 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 14 found articles
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