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Details for article 18 of 49 found articles
| Title: |
Exploration of Trap Levels in GaN and Al0.2Ga0.8N Layers by Temperature-Dependent Photoconductivity Measurement |
| Author: |
Prakash, Nisha Kumar, Gaurav Barvat, Arun Anand, Kritika Choursia, B. Pal, Prabir Khanna, Suraj P. |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 5 (2018) nr. 1P2 pages 2132-2138 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 49 found articles
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