Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
Titel:
Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
Auteur:
Grünwald, Eva Nuster, Robert Paltauf, Günther Maier, Thomas Wimmer-Teubenbacher, Robert Konetschnik, Ruth Kiener, Daniel Leitgeb, Verena Köck, Anton Brunner, Roland