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Details for article 25 of 84 found articles
| Title: |
Electron energy loss spectroscopy and energy filtered transmission electron microscopy of hydrogenated nano-crystalline Si thin films deposited via hydrogen profiling during hot-wire CVD for application in photovoltaics |
| Author: |
Cummings, Franscious van Heerden, Brian Arendse, Christopher Muller, Theophillus |
| Appeared in: |
Materials today: proceedings |
| Paging: | Volume 36 () nr. P2 pages 256-262 |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 84 found articles
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