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  Cu/ nano-CuO Thick Film/Cu Double Barrier Junction: Structural and Dielectric Study
 
 
Title: Cu/ nano-CuO Thick Film/Cu Double Barrier Junction: Structural and Dielectric Study
Author: Chenari, H. Mahmoudi
Appeared in: Materials today: proceedings
Paging: Volume 2 (2015) nr. 6 pages 5 p.
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 15 found articles
 
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