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  Atomic force microscopy nano-indentation for testing mechanical properties in thin films
 
 
Title: Atomic force microscopy nano-indentation for testing mechanical properties in thin films
Author: Roa, Simón
Haberkorn, N.
Sirena, Martín
Appeared in: Materials today: proceedings
Paging: Volume 14 (2019) nr. P1 pages 113-116
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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