|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 300 found articles
| Title: |
Atomic force microscopy data of novel high-k hydrocarbon films synthesized on Si wafers for gate dielectric applications |
| Author: |
Kwon, Jihwan Kim, Dong-Ok Lee, Sangyeob Kim, Eui-Tae |
| Appeared in: |
Data in brief |
| Paging: | Volume 30 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 300 found articles
| << previous | next >> |