Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects
Titel:
Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects
Auteur:
Javadi, Yashar MacLeod, Charles N. Pierce, Stephen G. Gachagan, Anthony Lines, David Mineo, Carmelo Ding, Jialuo Williams, Stewart Vasilev, Momchil Mohseni, Ehsan Su, Riliang