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Journal description
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Details for article 11 of 18 found articles
| Title: |
Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection |
| Author: |
Janssens, Eline Alves Pereira, Luis F. De Beenhouwer, Jan Tsang, Ing Ren Van Dael, Mattias Verboven, Pieter Nicolaï, Bart Sijbers, Jan |
| Appeared in: |
Case studies in nondestructive testing and evaluation |
| Paging: | Volume 6 (2016) nr. PB pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 18 found articles
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