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  Characterizing vibration-assisted atomic force microscopy (AFM)-based nanomachining via perception of acoustic emission phenomena using a sensor-based real-time monitoring approach
 
 
Title: Characterizing vibration-assisted atomic force microscopy (AFM)-based nanomachining via perception of acoustic emission phenomena using a sensor-based real-time monitoring approach
Author: Ma, Qiyang
Zhou, Huimin
Deng, Jia
Wang, Zimo
Appeared in: Manufacturing letters
Paging: Volume 34 () nr. C pages 6-11
Year: 2022
Contents:
Publisher: Society of Manufacturing Engineers (SME)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands