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                                       Details for article 100 of 154 found articles
 
 
  Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure
 
 
Title: Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure
Author: Almatrafi, Mohammed
Belaïd, Mohamed Ali
Appeared in: Case studies in thermal engineering
Paging: Volume 59 () nr. C pages p.
Year: 2024
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 100 of 154 found articles
 
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