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  In situ characterization of Si-based anodes by coupling synchrotron X-ray tomography and diffraction
 
 
Title: In situ characterization of Si-based anodes by coupling synchrotron X-ray tomography and diffraction
Author: Vanpeene, V.
King, A.
Maire, E.
Roué, L.
Appeared in: Nano energy
Paging: Volume 56 (2019) nr. C pages 799-812
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 50 of 92 found articles
 
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