Structural integrity—Searching the key factor to suppress the voltage fade of Li-rich layered cathode materials through 3D X-ray imaging and spectroscopy techniques
Titel:
Structural integrity—Searching the key factor to suppress the voltage fade of Li-rich layered cathode materials through 3D X-ray imaging and spectroscopy techniques
Auteur:
Xu, Yahong Hu, Enyuan Yang, Feifei Corbett, Jeff Sun, Zhihong Lyu, Yingchun Yu, Xiqian Liu, Yijin Yang, Xiao-Qing Li, Hong