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                                       Details for article 12 of 86 found articles
 
 
  Charge transport in semi insulating bulk 4H-Silicon carbide: Effect of metallization and wafer homogeneity
 
 
Title: Charge transport in semi insulating bulk 4H-Silicon carbide: Effect of metallization and wafer homogeneity
Author: Praus, P.
BetuĊĦiak, M.
Belas, E.
Kunc, J.
Grill, R.
Brynza, M.
Pipek, J.
Appeared in: Results in physics
Paging: Volume 43 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 86 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands