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Journal description
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Details for article 52 of 107 found articles
| Title: |
Impact of process-dependent SiNx passivation on proton-induced degradation in GaN MIS-HEMTs |
| Author: |
Yoon, Young Jun Lee, Jae Sang Kang, In Man Lee, Eun Je Kim, Dong-Seok |
| Appeared in: |
Results in physics |
| Paging: | Volume 31 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 52 of 107 found articles
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